Senior Director, Analytics
Mr. Lee is Senior Director of Legal Analytics at RPX Corporation where he focuses on analyzing patent litigation, prosecution, and market data to help clients better understand the patent industry. He also manages data analysis and research projects on new technologies.
Prior to joining RPX in 2018, Mr. Lee was an associate at WilmerHale, where he practiced patent litigation and prosecution. Before entering the legal industry, he worked in software development at IBM for ten years.
Mr. Lee earned his JD from Cornell Law School and received his BS from the University of Toronto.